The International Metrology Congress

The International Metrology Congress (CIM) will be back from 19 to 21 September 2017 in Paris to be devoted this year to measurement in industry. EA will co-facilitate a round table focusing on measurement and declaration of conformity under ISO/IEC 17025.

Alongside with the ENOVA show, the 18th CIM will gather about 1 000 participants from 50 countries – among which end-users of measurement technology in industry and laboratories, quality managers and decision makers, manufacturers of measuring equipment, distributors and providers, academics and researchers – to improve their knowledge of the technologies in measurement, explore industrial challenges and discover the latest innovations.

This 3-day event will include diversified conference and round table sessions, technical site visits and demonstrations, as well as an exhibition showcasing innovations and solutions.

Six round tables will enable direct and lively discussions on the following themes:

• drone-based inspection and monitoring: the role for measurement;
• measurement and declaration of conformity: the evolution of ISO/IEC 17025;
• dynamic measurement and factory of the future: the metrology asset;
• progress for measurement to nanoscale;
• metrology for innovation in the pharmaceutical industry;
• measurement for water quality.

Further information on round tables is available at http://www.cim2017.com/round-tables-cim-2017.html

As the co-facilitator of the round table on ISO/IEC 17025, Laurent Vinson is stating that “both as Director of the Laboratory Division of COFRAC, the French national accreditation body, and Chair of the EA Laboratory Committee, I consider it is important for accreditation to be visible and promoted within the Congress. Accreditation provides laboratories a sound, internationally-accepted recognition of their technical competence. The new version of ISO/IEC 17025 will reinforce the benefits for accredited laboratories. I am happy to facilitate the discussions during the round table with representatives of major interested parties, including ones that have directly contributed to the revision of the standard at the ISO level.”